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Supertek® Size of Particle Experiment

Size of particle apparatus
Catalog # 470331-762
Supertek® Size of Particle Experiment
Catalog # 470331-762
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Supertek® Size of Particle Experiment
Supertek® Size of Particle Experiment

Size of particle apparatus

Discontinued
Product has been discontinued. However we found similar alternative products.
Alternatives
EXP SETUP SIZE OF PARTICLE Catalog #470356-822

Product 470356-822 is similar to 470331-762 but may have a different manufacturer and/or packaging.

Product Details & Documents

Measure the width/thickness of the given samples by analyzing the diffraction pattern.

  • Adjustable laser allows easy alignment of the laser source with the sample
  • A laser range finder allows for use of any wall as a screen, increasing the distance between the screen and the sample
  • Multiple samples can be tested and verified using modular setup

The characteristics of light such as interference and diffraction can be understood when light is studied as a wave phenomenon. Interaction of waves with matter results in either transmission, reflection, absorption, or diffraction of the wave. When the size of the matter is comparable to the wavelength of the wave that it interacts with, a phenomenon called diffraction occurs.

Diffraction of light due to particles is a function of the size of the particle and the wavelength of the light incident. It is possible to measure the size of a particle by studying the diffraction patterns created by it.

Delivery information: Kit includes optical bench set 0.8 m, laser source holder, grating holder, screen holder, laser distance meter, diffraction grating, frame with thread type 1, frame with thread type 2, frame with thread type 3.

Specifications
  • Description:
    Size of particle apparatus