You searched for: Color Reference and Spectroscopy Standards

Supplier: Electron Microscopy Sciences

A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

Supplier: Electron Microscopy Sciences

Spray droplet sizing reticle for size and distribution assessments of aersol droplets. Used in conjunction with a 40x Microscope for direct measurements of droplets from 50 to 400 μm diameter.

Supplier: Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Reflected light calibration slide with 0.1" length scale subdivided into 0.001" divisions.

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification.

Supplier: FIREFLYSCI, INC.

Kit consists of three filters and a blank for validating photometric accuracy and linearity in the range of 200 to 3000 nm.

Supplier: Electron Microscopy Sciences

Certified standards for system calibration in 13 mm aluminium pin stub.

Supplier: Wako Life Sciences

The NEFA Linearity Set is a 2.5 mEq/L solution used to verify the measurable range of the NEFA HR(2) assay.

Supplier: Electron Microscopy Sciences

MAC X-ray Microanalysis standards are supplied as 33 m (¹/₄") diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: FIREFLYSCI, INC.

Firefly’s FUV Dual Series filters allow you to verify photometric accuracy and stray light in the range of 200 - 700 nm. Includes certified values for both the front and back of the filter for determining stray light.

Supplier: Electron Microscopy Sciences

All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

Supplier: FIREFLYSCI, INC.

Firefly's upgraded and improved version of the NIST-2031 UV/VIS photometric accuracy kit.

Supplier: Electron Microscopy Sciences

The standard test specimen keeps the scanning electron microscope up to peak operating conditions.

Supplier: Ricca Chemical

USP Colorimetric Solution. (1 mL = 62.4 mg CuSO4*5H2O). Container: Glass.

Supplier: Electron Microscopy Sciences

MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). (Auger electron: one of the electrons ejected from an atom as a result of the internal conversion of its own X-ray in the auger effect. Auger effect: a process in which an atom singly ionized by emitting one electron with energy in the X-ray range instead of emitting the usual X-ray photon on recovery undergoes a transition in which a second electron is emitted).

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems

Supplier: FIREFLYSCI, INC.

Firefly's FUV neutral density solid-state filter series tests photometric accuracy in the UV and VIS range from 200-700nm. Our solid-state nano-deposition technology produces unparalleled stability and means that you will never need to recalibrate this filter.

Supplier: Electron Microscopy Sciences

The TEM Checker contains 5 manganese discs in a standard grid storage box. The discs are not transparent to the beam but gives a strong manganese peak to check the resolution of EDS detector.

Supplier: ELECTRON MICROSCOPY SCIENCE

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Hach

Calibration solutions for Lico spectral colorimeter.

Supplier: Hach

For accuracy checks in color determinations.

Supplier: Invitrogen

This triple quadrupole calibration solution, extended mass range, is a mixture of 14 highly pure, ionizable components designed for both positive and negative ionization calibration of triple stage quadrupole instruments.

Supplier: LUMINEX MS

MAGPIX® Calibration and Verification Kits, Luminex

Supplier: Aqua Solutions

The solution contains potassium platinum chloride, hydrochloric acid 36-38% and water.

Supplier: Microsolv Technology Corp

Wavelength Calibration Standard is composed of 4% Holmium Oxide in 10% Perchloric Acid.

Supplier: MICROGENICS CORP (FKA DUKE) MS

COUNT-CAL™ count precision size standards, are easy to use product for validating liquid particle counters.